Electronics Business Journal
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Research conducted by A. Diaz and co-researchers has updated our knowledge about electromagnetic research
May 26th, 2010
"A study of the coherence and wavefront properties of a pseudo-channel-cut monochromator in comparison with a double-crystal monochromator is presented. Using a double-grating interferometer designed for the hard X-ray regime, the complex coherence factor was measured and the wavefront distortions at the sample position were analyzed," researchers in Villigen, Switzerland report.
"A transverse coherence length was found in the vertical direction that was a factor of two larger for the channel-cut monochromator owing to its higher mechanical stability. The wavefront distortions after different optical elements in the beam, such as monochromators and mirrors, were also...
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Source: Electronics Business Journal (2010-05-26)