Electronics Newsweekly
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Microelectronics
Study Results from M.G. Meeder and Colleagues Update Understanding of Microelectronics
April 13th, 2011
According to recent research from Greensboro, United States, "Electro-Static Discharge (ESD) is a common cause of failure for RF semiconductors during module assembly processes and service of the RF modules in end-customer applications (i.e. field service)." "To develop and verify semiconductor capacitor designs with sufficient ruggedness to withstand a given ESD environment during customer assembly and field service, sufficient quantities of devices need to be tested to determine larger failure voltage distributions rather than the minimal three required for product qualification (Electrostatic Discharge (ESD) [1,2])," wrote M.G. Meeder and...
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Source: Electronics Newsweekly (2011-04-13)
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