Journal of Technology
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Investigators at Bhabha Atomic Research Center Describe Research in Vacuum Technology
January 31st, 2012
"Composite thin films of HfO2:SiO2 with wide range of relative composition from 100:0 (pure HfO2) to 10:90 have been deposited on fused silica substrates by co-evaporation technique and the optical properties of the films have been studied by measuring the transmission spectra of the samples by spectrophotometer," investigators in Maharashtra, India report.
"Different important optical parameters viz., band gap, refractive index and absorption coefficients of the samples have been obtained by fitting the measured optical spectra with theoretically generated spectra and the variation of the optical constants as a function of SiO2 content in the films have been obtained. Two...
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Source: Journal of Technology (2012-01-31)